Dependence of Thermal Annealing on the Density Distribution of Interface States In Ti/n-GaAs(Te) Schottky Diodes

AYYILDIZ E.

Appl. Surf. Sci., vol.152, pp.57-62, 1999 (SCI-Expanded)

  • Publication Type: Article / Article
  • Volume: 152
  • Publication Date: 1999
  • Journal Name: Appl. Surf. Sci.
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED)
  • Page Numbers: pp.57-62
  • Erciyes University Affiliated: No