Intelligent modelling of alpha (alpha) parameter; comparison of ANN and ANFIS cases


Celebi F. V. , Yucel M., Goktas H. H. , DANIŞMAN K.

OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, vol.7, pp.470-474, 2013 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 7
  • Publication Date: 2013
  • Title of Journal : OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS
  • Page Numbers: pp.470-474

Abstract

In this study, intelligent models are proposed for the Alpha (alpha) parameter or so called linewidth enhancement factor (LEF) which is an important parameter influencing many static, dynamic and noise characteristics of semiconductor lasers. The models are obtained with the use of artificial neural network (ANN) and adaptive neuro-fuzzy inference system (ANFIS) approaches. The proposed approaches are in very good agreement with the previously published experimental values.