Intelligent modelling of alpha (alpha) parameter; comparison of ANN and ANFIS cases
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, vol.7, pp.470-474, 2013 (SCI-Expanded, Scopus)
- Publication Type: Article / Article
- Volume: 7
- Publication Date: 2013
- Journal Name: OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS
- Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Page Numbers: pp.470-474
- Erciyes University Affiliated: Yes
Abstract
In this study, intelligent models are proposed for the Alpha (alpha) parameter or so called linewidth enhancement factor (LEF) which is an important parameter influencing many static, dynamic and noise characteristics of semiconductor lasers. The models are obtained with the use of artificial neural network (ANN) and adaptive neuro-fuzzy inference system (ANFIS) approaches. The proposed approaches are in very good agreement with the previously published experimental values.