Intelligent modelling of alpha (alpha) parameter; comparison of ANN and ANFIS cases

Celebi F. V., Yucel M., Goktas H. H., DANIŞMAN K.

OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, cilt.7, ss.470-474, 2013 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 7
  • Basım Tarihi: 2013
  • Dergi Adı: OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.470-474
  • Erciyes Üniversitesi Adresli: Evet

Özet

In this study, intelligent models are proposed for the Alpha (alpha) parameter or so called linewidth enhancement factor (LEF) which is an important parameter influencing many static, dynamic and noise characteristics of semiconductor lasers. The models are obtained with the use of artificial neural network (ANN) and adaptive neuro-fuzzy inference system (ANFIS) approaches. The proposed approaches are in very good agreement with the previously published experimental values.