Correlation between barrier heights and ideality factors of H-terminated Sn/p-Si (100) Schottky barrier diodes

AYYILDIZ E.

MICROELECTRONIC ENGINEERING, vol.85, pp.721-726, 2008 (SCI-Expanded)

  • Publication Type: Article / Article
  • Volume: 85
  • Publication Date: 2008
  • Journal Name: MICROELECTRONIC ENGINEERING
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.721-726
  • Erciyes University Affiliated: Yes