In this paper, we explain the production of chromium telluride (Cr2Te3) crystalline thin film via chemical bath deposition on substrates (commercial glass). Properties of the thin film, such as transmittance, absorption, optical band gap and refraction were examined in ultra-violet Spectrum. The structural properties of orthorhombic form were observed through X-ray diffraction. Structural and optical properties of Cr2Te3 thin films that were deposited at different pH levels were compared. Some properties of the films have changed with the change of pH, which has been deeply investigated. It has been observed that grain size of Cr2Te3 thin film has reached its highest value at pH 9. The refraction indexes and extinction coefficients of Cr2Te3 films deposited at various pH levels were calculated as 1.45, 1.82, 1.78, 1.40 (refraction index) - 0.004, 0.010, 0.009, 0.003 (extinction coefficient), for amorphous structure with 24, 42 and 63 nm average grain sizes (at 550 nm wavelength). The band gaps (Eg) of the films were measured as 2.06, 2.57, 2.04, and 2.76 eV for the grain sizes mentioned above.