In this study, a new method for the production of vanadium oxide thin films has been developed. Structural analyzes of films produced in the study were performed by FTIR; whereas surface properties were examined by SEM analysis. Optical properties were measured by UV-VIS spectrophotometer and electrical characterizations were made by I/V measurements. Optical transmission curves were found to be near 60% in the vicinity of the NIR region, with a refractive index around 2.11. Films produced with urease were found to have a resistivity of less than 0.01 Omega cm. It was observed that film thicknesses varied in the range of 35-62 nm regarding the measurements made with AFM device. Surface tensions of the films were calculated using the Zismann method, which were found to vary from 19.4 to 41.5 mN/m. (c) 2018 Elsevier B.V. All rights reserved.