Measurements of electrical and thermal properties with growth rate, alloying elements and temperature in the Al-Si-X alloys


Aker A., Kaya H.

INTERNATIONAL JOURNAL OF CAST METALS RESEARCH, cilt.30, ss.293-300, 2017 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 30
  • Basım Tarihi: 2017
  • Doi Numarası: 10.1080/13640461.2017.1307623
  • Dergi Adı: INTERNATIONAL JOURNAL OF CAST METALS RESEARCH
  • Sayfa Sayıları: ss.293-300

Özet

In this work, effect of alloying elements (X = Cu, Co, Ni, Sb and Bi) and growth rates on the microstructure, physical properties (electrical resistivity, enthalpy and specific heat) of the directionally solidified Al-Si eutectic alloy have been investigated. Al-12.6Si-2X (wt. %) samples were prepared using metals of 99.99% high purity in the vacuum atmosphere. These alloys were directionally solidified under constant temperature gradient, G (7.80K/mm) and different growth rates, V (8.3-166.0 mu m/s). Flake spacing (lambda) and electrical resistivity (rho) were measured from the solidified samples. The variation of electrical resistivity with temperature in the range of 300-500K for alloying elements in the Al-Si eutectic cast alloy was also measured. The enthalpy of fusion (Delta H) and specific heat (C-p) for the same alloy were determined by a differential scanning calorimeter from the heating curve during the transformation from solid to liquid.