A NEW APPROACH TO PREPARE POLYCRYSTALLINE PbTe-TeO THIN FILM, AND ITS OPTICAL, STRUCTURAL, SURFACE AND ELECTRICAL CHARACTERIZATION

Tezel F. M., KARİPER İ. A.

SURFACE REVIEW AND LETTERS, cilt.28, sa.04, 2021 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 28 Sayı: 04
  • Basım Tarihi: 2021
  • Doi Numarası: 10.1142/s0218625x21500190
  • Dergi Adı: SURFACE REVIEW AND LETTERS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, Metadex, Civil Engineering Abstracts
  • Anahtar Kelimeler: Polycrystalline PbTe-TeO, thin film, CBD method, optical conductivity, electrical conductivity, energy bandgap, ELECTRODEPOSITION, DEPOSITION, BAND
  • Erciyes Üniversitesi Adresli: Evet

Özet

In this study, PbTe thin film was produced on glass substrates, via chemical bath deposition (CBD) method, with 3-h deposition time at 50(circle)C. The produced thin film had polycrystalline structure; TeO2, PbTe, PbTe3 and Te2O5 crystals that were characterized by X-ray diffraction (XRD) had tetragonal, cubic, tetragonal and monoclinic crystal structures, respectively. Reflectivity (R; in %), optical transmission (T; in %), optical bandgap (Eg), absorption, dielectric constant (epsilon), extinction coefficient (k) and refractive index (nr) of polycrystalline PbTe thin film obtained using UV-Vis spectrophotometer were 29.87%, 19.41%, 3.30eV, 0.6, 3.72, 0.05 and 4.08, respectively. Grain sizes of polycrystalline PbTe thin film varied between 8.79nm and 52.55nm. Optical and electrical conductivities of the crystals according to photon energy were calculated using optical parameters, whereas their surface morphology was characterized by scanning electron microscopy (SEM). The thickness of polycrystalline PbTe thin film was measured by atomic force microscopy (AFM), and found to be 900nm.