Matching Day and Night Location Images Using SIFT and Logistic Regression

Tekin N., Peker K. A.

23nd Signal Processing and Communications Applications Conference (SIU), Malatya, Türkiye, 16 - 19 Mayıs 2015, ss.1615-1618 identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası:
  • Doi Numarası: 10.1109/siu.2015.7130159
  • Basıldığı Şehir: Malatya
  • Basıldığı Ülke: Türkiye
  • Sayfa Sayıları: ss.1615-1618
  • Erciyes Üniversitesi Adresli: Hayır

Özet

SIFT is use for matching images of location and objects or recognizing objects on an image. the method can handle light varying conditions at some points. However the degree of success decreases when we try to match images of locations taken at day to until night time period. Especially matching between day time image and night time image is not successful. We examined how to performance of SIFT method diminish with the change of daylight The other method classification used in matching problem is also examined and compared with SIFT.