Silver and lead were co-precipitated in bath with iodine. The precipitate of Pb-AgI has been deposited on glass substrates. Pb-AgI mixing thin film was researched in terms of structural, optical and electrical properties. The structures of the films were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM). Uniform distribution of grains is clearly seen in the photograph of scanning electron microscope (SEM). The optical properties were researched and analyzed with UV-VIS. The form of Pb-AgI film depended on deposition temperature and deposition time. The transmittance and optical band gap decreased with deposition temperature which were 90-80 % and 4.08-4.11, respectively. AgI structure was observed in XRD analysis and this structure was dominant in the films. The atom ratios of lead and silver changed with deposition temperature. Film thickness of Pb-AgI thin films decreased with deposition temperature.