Automation Software for Semiconductor Research Laboratories: Electrical Parameter Calculation Program (SeCLaS-PC)

Akkaya A., AYYILDIZ E.

JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, cilt.29, sa.13, 2020 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 29 Sayı: 13
  • Basım Tarihi: 2020
  • Doi Numarası: 10.1142/s0218126620502151
  • Dergi Adı: JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Applied Science & Technology Source, Compendex, Computer & Applied Sciences, INSPEC
  • Anahtar Kelimeler: I-V, C-V, C-f, VEE pro, metal-semiconductor contacts, SCHOTTKY BARRIERS, INTERFACE, TRANSPORT, CONTACT, VOLTAGE, DIODES, INHOMOGENEITY, HEIGHT
  • Erciyes Üniversitesi Adresli: Evet

Özet

We prepared a simple program for basic electrical measurements and parameter extraction from these measurements of metal-semiconductor (MS) contacts. In this paper, we introduce a basic electrical parameter calculation software (SeCLaS-PC) for semiconductor laboratories from the temperature-dependent/independent current-voltage (I-V), capacitance- voltage (C-V) and capacitance-frequency (C-f) measurement results. SeCLaS-PC program was developed using Keysight VEE Pro (Visual Engineering Environment) software and the program has a user-friendly graphical interface. More than 50 device parameters can be easily obtained, using different methods, from the C-f, temperature-dependent I-V and temperature-dependent C-V measurement results for one device, with our SeCLaS-PC program.