Automation Software for Semiconductor Research Laboratories: Electrical Parameter Calculation Program (SeCLaS-PC)


Akkaya A., AYYILDIZ E.

JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, vol.29, no.13, 2020 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 29 Issue: 13
  • Publication Date: 2020
  • Doi Number: 10.1142/s0218126620502151
  • Title of Journal : JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS

Abstract

We prepared a simple program for basic electrical measurements and parameter extraction from these measurements of metal-semiconductor (MS) contacts. In this paper, we introduce a basic electrical parameter calculation software (SeCLaS-PC) for semiconductor laboratories from the temperature-dependent/independent current-voltage (I-V), capacitance- voltage (C-V) and capacitance-frequency (C-f) measurement results. SeCLaS-PC program was developed using Keysight VEE Pro (Visual Engineering Environment) software and the program has a user-friendly graphical interface. More than 50 device parameters can be easily obtained, using different methods, from the C-f, temperature-dependent I-V and temperature-dependent C-V measurement results for one device, with our SeCLaS-PC program.