Bilgen, Y. Et Al. 2022. Physical investigations of vanadium oxide thin films on p-Si substrate. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.20 , 16263-16271.

Bilgen, Y., Pakma, O., KARİPER, İ. A., & Ozden, S., (2022). Physical investigations of vanadium oxide thin films on p-Si substrate. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.20, 16263-16271.

Bilgen, Y. Et Al. "Physical investigations of vanadium oxide thin films on p-Si substrate," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.20, 16263-16271, 2022

Bilgen, Y. Et Al. "Physical investigations of vanadium oxide thin films on p-Si substrate." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.20, pp.16263-16271, 2022

Bilgen, Y. Et Al. (2022) . "Physical investigations of vanadium oxide thin films on p-Si substrate." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.20, pp.16263-16271.

@article{article, author={Y. Bilgen Et Al. }, title={Physical investigations of vanadium oxide thin films on p-Si substrate}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2022, pages={16263-16271} }