Danisman, K. Et Al. 1998. Different approach for distortion analysis of external cavity laser diode using volterra series. SPIE Conference on Laser Diodes and Applications III , (Quebec, Canada), 192-198.

Danisman, K., YILDIRIM, R., OZEK, A., & CELEBI, F., (1998). Different approach for distortion analysis of external cavity laser diode using volterra series . SPIE Conference on Laser Diodes and Applications III (pp.192-198). Quebec, Canada

Danisman, KENAN Et Al. "Different approach for distortion analysis of external cavity laser diode using volterra series," SPIE Conference on Laser Diodes and Applications III, Quebec, Canada, 1998

Danisman, KENAN Et Al. "Different approach for distortion analysis of external cavity laser diode using volterra series." SPIE Conference on Laser Diodes and Applications III , Quebec, Canada, pp.192-198, 1998

Danisman, K. Et Al. (1998) . "Different approach for distortion analysis of external cavity laser diode using volterra series." SPIE Conference on Laser Diodes and Applications III , Quebec, Canada, pp.192-198.

@conferencepaper{conferencepaper, author={KENAN DANIŞMAN Et Al. }, title={Different approach for distortion analysis of external cavity laser diode using volterra series}, congress name={SPIE Conference on Laser Diodes and Applications III}, city={Quebec}, country={Canada}, year={1998}, pages={192-198} }