A. AKKAYA Et Al. , "Effect of RF Power and Sputtering Background Pressure on Structural Properties of a:Si," 2nd International Congress on Semiconductor Materials and Devices (ICSMD 2018) , Ardahan, Turkey, 2018
AKKAYA, A. Et Al. 2018. Effect of RF Power and Sputtering Background Pressure on Structural Properties of a:Si. 2nd International Congress on Semiconductor Materials and Devices (ICSMD 2018) , (Ardahan, Turkey).
AKKAYA, A., GÜNERİ, E., SOYLU, M. Ç., ÇETİN, H., & AYYILDIZ, E., (2018). Effect of RF Power and Sputtering Background Pressure on Structural Properties of a:Si . 2nd International Congress on Semiconductor Materials and Devices (ICSMD 2018), Ardahan, Turkey
AKKAYA, ABDULLAH Et Al. "Effect of RF Power and Sputtering Background Pressure on Structural Properties of a:Si," 2nd International Congress on Semiconductor Materials and Devices (ICSMD 2018), Ardahan, Turkey, 2018
AKKAYA, ABDULLAH Et Al. "Effect of RF Power and Sputtering Background Pressure on Structural Properties of a:Si." 2nd International Congress on Semiconductor Materials and Devices (ICSMD 2018) , Ardahan, Turkey, 2018
AKKAYA, A. Et Al. (2018) . "Effect of RF Power and Sputtering Background Pressure on Structural Properties of a:Si." 2nd International Congress on Semiconductor Materials and Devices (ICSMD 2018) , Ardahan, Turkey.
@conferencepaper{conferencepaper, author={ABDULLAH AKKAYA Et Al. }, title={Effect of RF Power and Sputtering Background Pressure on Structural Properties of a:Si}, congress name={2nd International Congress on Semiconductor Materials and Devices (ICSMD 2018)}, city={Ardahan}, country={Turkey}, year={2018}}