E. Ayyildiz Et Al. , "The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/N-Si Schottky barrier diodes," JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.2, pp.119-123, 2002
Ayyildiz, E. Et Al. 2002. The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/N-Si Schottky barrier diodes. JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.2 , 119-123.
Ayyildiz, E., Lu, C., & Turut, A., (2002). The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/N-Si Schottky barrier diodes. JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.2, 119-123.
Ayyildiz, ENİSE, CNH Lu, And A Turut. "The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/N-Si Schottky barrier diodes," JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.2, 119-123, 2002
Ayyildiz, ENİSE Et Al. "The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/N-Si Schottky barrier diodes." JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.2, pp.119-123, 2002
Ayyildiz, E. Lu, C. And Turut, A. (2002) . "The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/N-Si Schottky barrier diodes." JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.2, pp.119-123.
@article{article, author={ENİSE AYYILDIZ Et Al. }, title={The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/N-Si Schottky barrier diodes}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2002, pages={119-123} }