A. Akkaya And E. Ayyildiz, "Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC)," MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA , vol.35, no.3, pp.343-350, 2020
Akkaya, A. And Ayyildiz, E. 2020. Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC). MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA , vol.35, no.3 , 343-350.
Akkaya, A., & Ayyildiz, E., (2020). Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC). MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA , vol.35, no.3, 343-350.
Akkaya, A., And ENİSE AYYILDIZ. "Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC)," MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA , vol.35, no.3, 343-350, 2020
Akkaya, A. And Ayyildiz, ENİSE. "Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC)." MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA , vol.35, no.3, pp.343-350, 2020
Akkaya, A. And Ayyildiz, E. (2020) . "Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC)." MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA , vol.35, no.3, pp.343-350.
@article{article, author={A. Akkaya And author={ENİSE AYYILDIZ}, title={Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC)}, journal={MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA}, year=2020, pages={343-350} }