McLeod, E. Et Al. 2015. High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy. ACS NANO , vol.9, no.3 , 3265-3273.

McLeod, E., Dincer, T. U., Veli, M., Ertas, Y. N., Chau Nguyen, C. N., Luo, W., ... Greenbaum, A.(2015). High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy. ACS NANO , vol.9, no.3, 3265-3273.

McLeod, Euan Et Al. "High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy," ACS NANO , vol.9, no.3, 3265-3273, 2015

McLeod, Euan Et Al. "High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy." ACS NANO , vol.9, no.3, pp.3265-3273, 2015

McLeod, E. Et Al. (2015) . "High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy." ACS NANO , vol.9, no.3, pp.3265-3273.

@article{article, author={Euan McLeod Et Al. }, title={High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy}, journal={ACS NANO}, year=2015, pages={3265-3273} }